Micron
Senior Reticle Pattern Inspection Process Engineer
Boise, ID - Main Site · Senior · Full-time · Posted Oct 19, 2026
- Experience
- 5+ years.
- Education
- Master's degree in Physics, Optics, Electrical Engineering, Materials Science, Mechanical Engineering, Chemical Engineering, or related field; or Bachelor's degree with significant directly relevant industry experience.
About the job
Develops and optimizes reticle pattern inspection solutions for current and next-generation lithography, improving defect detection, yield, and manufacturing readiness.
What you'll do
- Develop, qualify, optimize, and sustain reticle inspection processes, including EUV inspection and automated defect classification.
- Lead defect characterization, printability assessment, mask-to-wafer correlation, and root-cause investigations.
- Lead equipment qualifications and technology assessments, and collaborate across teams and with suppliers to introduce inspection capabilities.
What they ask for
- Master's degree in a specified or related field, or Bachelor's degree with significant directly relevant industry experience.
- 5+ years of experience in photomask engineering, reticle or wafer inspection, semiconductor defect engineering, advanced lithography, or related semiconductor manufacturing.
- Experience developing, optimizing, qualifying, or sustaining advanced inspection processes and manufacturing systems.
- Strong understanding of defect detection, classification, inspection sensitivity, nuisance reduction, and process optimization; experience leading technical projects and using statistical and structured problem-solving methods.
Nice to have
- Experience with EUV reticle inspection, High-NA EUV, defect printability, or mask-to-wafer correlation.
- Experience with lithography simulation, aerial image analysis, machine learning, advanced analytics, or AI-enabled inspection solutions.
Tools
EUV, High-NA EUV, SPC, FMEA, 8D, machine learning
AI focus
Develop or use machine learning, advanced analytics, and AI-enabled workflows for automated defect classification and inspection solutions.
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